FEIS-2: Femtosecond Electron Imaging and Spectroscopy

Announcement

The international conference FEIS-2 is the second in a series of meetings that began in 2013 in Key West, and after this meeting will continue in the Netherlands in 2016, organized by Prof. Jom Luiten, and China in 2017, organized by Prof. Dao Xiang.

The themes of FEIS-2 focus on the investigation of the structure and spectroscopy of matter with atomistic space and femtosecond time resolution, enabled by the development of extremely bright radiation sources, such as high-brightness X-ray and electron beam systems. We are witnessing significant progress and growing shared interest in femtosecond imaging and spectroscopy communities. The capabilities of generating ultrabright sources and very high level of control in delivering intense electron beams through tuning of source geometry, pulse shaping, laser-electron pulse synchronization, and understanding of space-charge effects are now synergistically enabling ultrabright electron microscopes and electron microdiffraction systems for femtosecond imaging and spectroscopy.

FEIS-2 will bring together leaders engaged in cutting edge development of high-brightness electron and X-ray beam systems and their applications to frontier science problems, in order to showcase recent progress and discuss future directions and opportunities. It will also attempt to draw comparisons to other recently emerging approaches to ultrafast observation. The workshop will build on the potential synergy between related technology developments and various emerging scientific opportunities.

Deadlines and Dates

Registration Deadline: April 7
Abstract Submission Deadline: April 7
Meeting: May 6th - 9th, 2015
Hotel Reservation Deadline: April 17 for Radisson

Workshop Themes include

Synergy in the development of ultrafast X-ray and electron characterization techniques

• Understanding and mitigating high intensity beam effects on materials
• Fundamental challenges in designing ultrafast coherent and high-brightness microscopes (source, optical system, detection, and pump technology)
• Novel molecular and material processes unveiled by ultrafast electron microscopy, diffraction, and spectroscopy
• In-situ microscopy and spectroscopy

Novel processes unveiled by ultrafast microscopy, diffraction, and spectroscopy

• Quantum dynamics and hidden states
• Atomic scale single-particle dynamics and molecular processes
• Mesoscopic materials and phenomena
• Materials under extreme environments

Tutorials (tentative)

• Ultrafast electron diffraction and microscopy
• Beam dynamic
• Image formation
• Electron spectroscopy
• Laser pulse shaping

Scientific Committee

• Thomas Devereaux (Stanford/SLAC)
• Valery Dolgashev (SLAC)
• Ludek Frank (Brno)
• Jim Freericks (Georgetown)
• Peter Hawkes (Toulouse)
• Jom Luiten (Eindhoven)
• Margaret Murnane (Colorado/JILA)
• Jerry Nolen (ANL)
• Hrvoje Petek (Pittsburgh)
• Harald Rose (Ulm)
• Dao Xiang (Shanghai Jiao Tong University)
• John Spence (Arizona State)
• Weishi Wan (LBNL)
• Linda Young (Argonne)
• Ahmed Zewail (Caltech)
• Jie Zhang (Shanghai Jiao Tong University)
• Yimei Zhu (BNL)

Organizing Committee

We gratefully acknowledge the Center of Research Excellence in Complex Materials at Michigan State University, Shanghai Jiao Tong University, the US Department of Energy, and the US National Science Foundation for support.

Participanting partners